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Nicolas Lietaer

Seniorforsker

Nicolas Lietaer

Seniorforsker

Nicolas Lietaer
Telefon: 932 61 786
E-post:
Avdeling: Microsystems and Nanotechnology
Kontorsted: Oslo

Publikasjoner og ansvarsområder

Publikasjon
https://www.sintef.no/publikasjoner/publikasjon/1879324/

In order to support the high luminosity upgrades at ATLAS and CMS, thinned silicon sensors for hybrid pixel detectors are critical to improve radiation hardness, reduce detector mass, and address high occupancy rates. Because silicon wafer processing tools are not equipped to handle thin wafers, the...

Forfattere Julie Segal Nicolas Lietaer Marco Povoli
År 2019
Type Poster
Publikasjon
https://www.sintef.no/publikasjoner/publikasjon/1678253/

SINTEF in collaboration with University of Oslo have been performing R&D activities on 3D detectors with the aim to qualify to be a production site for ITk upgrade. In this context, a 3D detector fabrication run has been completed recently with very promising results. Various sensor geometries...

Forfattere Ozhan Koybasi Marco Povoli Angela Chun Ying Kok Anand Summanwar Lars Breivik Trond Andreas Hansen Nicolas Lietaer Ole Myren Røhne Heidi Sandaker
År 2018
Type Vitenskapelig foredrag
Publikasjon
https://www.sintef.no/publikasjoner/publikasjon/1458745/

Metalized micron scale polymer particles have been utilised in anisotropically conductive adhesives for a number of years and more recent work has investigated their selective deposition to provide interconnects. In this work such particles have successfully been deposited onto substrates that...

Forfattere Mark W, Sugden Junlei Tao Changqing Liu David A. Hutt David C. Whalley Nicolas Lietaer
År 2016
Type Vitenskapelig Kapittel/Artikkel/Konferanseartikkel
Publikasjon
https://www.sintef.no/publikasjoner/publikasjon/1392949/

Device encapsulation and packaging often constitutes a substantial part of the fabrication cost of micro electro-mechanical systems (MEMS) transducers and imaging sensor devices. In this paper, we propose a simple and cost-effective wafer-level capping method that utilizes a limited number of highly...

Forfattere Simon J. Bleiker Maaike Margrete Visser Taklo Nicolas Lietaer Andreas Vogl Thor Bakke Frank Niklaus
År 2016
Type Vitenskapelig artikkel
Publikasjon
https://www.sintef.no/publikasjoner/publikasjon/917490/

...3D active edge sensors have advantages such as radiation hardness and edgeless capability. With the use of deep reactive ion etching and wafer bonding, 18.5 by 20.5 mm2 3D detectors with active edges have been successfully fabricated at SINTEF MiNaLab. These sensors are compatible with the ATLAS FE...

Forfattere Angela Chun Ying Kok M. Boscardin G-F. Dalla Betta Cinzia Da Via G. Darbo C. Fleta Thor-Erik Hansen Jasmine Hasi Christopher Kenney Nicolas Lietaer M. Lozano Sherwood Parker G. Pellegrini Anand Summanwar
År 2012
Type Vitenskapelig Kapittel/Artikkel/Konferanseartikkel