Geometric phase analysis has been applied to high resolution aberration corrected (scanning) transmission electron microscopy images of InAs/GaAs quantum dot (QD) materials. We show quantitatively how the lattice mismatch induced strain varies on the atomic scale and tetragonally distorts the...
- Forfattere
- Per Erik Vullum
- Magnus Kristofer Nord
- Maryam Vatanparast
- Sedsel Fretheim Thomassen
- Chris Boothroyd
- Randi Holmestad
- Bjørn-Ove Fimland
- Turid Worren Reenaas
- År
- 2017
- Type
- Vitenskapelig artikkel