X-ray photoelectron spectroscopy study of MgH2 thin films grown by reactive sputtering

Forfatter(e)

• Ingvild Julie Thue Jensen
• Spyros Diplas
• Ole Martin Løvvik
• J Watts
• S Hinder
• H Schreuders
• B Dam

Institusjon(er)

• SINTEF AS
• Technische Universiteit Delft
• University of Surrey
• Universitetet i Oslo

Hefte nr.

6-7

DOI