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Plastic Deformation of Thin Si Membranes in Si-Si Direct Bonding

Sammendrag

The effect of bond anneal in Si-Si direct bonding of laminates With thin membranes suspending closed cavities is studied. For membranes of a certain size and thickness, it is found that the under-pressure in the cavity during bond anneal leads to plastic deformation of the membrane. By controlling the cavity pressure it is found that the Si crystal of the membrane can be kept intact during bond anneal.
Les publikasjonen

Kategori

Vitenskapelig artikkel

Oppdragsgiver

  • Research Council of Norway (RCN) / 247781

Språk

Engelsk

Forfatter(e)

Institusjon(er)

  • SINTEF Digital / Smart Sensors and Microsystems

År

2016

Publisert i

ECS Transactions

ISSN

1938-5862

Forlag

Electrochemical Society

Årgang

75

Hefte nr.

9

Side(r)

311 - 319

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