Til hovedinnhold

Fabrication of active-edge detectors without support wafer using a unique "perforated edge" approach

Fabrication of active-edge detectors without support wafer using a unique "perforated edge" approach

Kategori
Faglig foredrag
Språk
Engelsk
Institusjon(er)
  • SINTEF Digital / Microsystems and Nanotechnology
Presentert på
14th Trento Workshop on Advanced Silicon Radiation Detectors
Dato
25.02.2019 - 27.02.2019
År