Sammendrag
Several new methods for characterization of nano structrued materials prepared by severe plastic deformation, 3D-EBSD, 3D-atom probe tomography and TEM-based EBSD are introduced. Some applicaiton examples are given.
New Characterization methods for SPD nanostructured materials--invited talk
Kategori
Vitenskapelig foredrag
Språk
Engelsk
Forfatter(e)
- Yanjun Li
Institusjon(er)
- SINTEF Industri / Materialer og nanoteknologi
Presentert på
NTNU, Nano_SPD workshop
Sted
Kristiansund, Norway
Dato
14.12.2010 - 15.12.2010
Arrangør
Department of Materials Science and Engineering, NTNU