930 04 471
- Unit:
- SINTEF Industry
- Department:
- Metal Production and Processing
- Office:
- Oslo
Publications
- A workflow for synthetic data generation and predictive maintenance for vibration data
- Statistical analysis of structure loss in Czochralski silicon growth
- Assessment of feature engineering and long short-term memory for structure loss identification from process data in monocrystalline silicon growth by the Czochralski method
- Statistical Analysis of Structure Loss in Czochralski Silicon Growth
- Structure Loss in Czochralski Silicon Growth: Statistical Analysis of Growth Parameters and Modeling of Thermal Fluctuations
- Impact of thermal history on defects formation in the last solid fraction of Cz silicon ingots
- Structure loss in Czochralski silicon ingots
- Investigation of structure loss in industrial Czochralski silicon ingots: Effect of pores
- Nonlinear model predictive control of the Czochralski Process
- Sintef skal bygge batteriskip i Afrika