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Cracks, inclusions and microscopy of Si at SINTEF ICT

...inspection of silicon wafers at SINTEF ICT has a focus on micro crack detection and NIR microscopy. The Scanning Near Infra-Red Microscopy (SNIRM) configuration and experimental setup, as well as measurement results on microcracks and inclusions were presented. Short introduction to immersion optics with silicon...

Authors
Mats Stefan Carlin
Lars Johnsen
Kay Gastinger
Year
2010
Type
Conference lecture
Publication

Potential and Limitations for ""Domain Decomposition"" Multiscale Methods

...of correction functions and extra iterations to account for effects that cannot be described by a homogeneous Poisson-type equations. Hence, the resulting methods have many similarities with classical domain decomposition methods.   We outline and discuss various workflows and simulation settings where...

Authors
Knut-Andreas Lie
Year
2010
Type
Conference lecture
Publication

Moving Costs and the dynamics of Housing Demand

Artikkelen studerer husholds etterspørsel etter bolig som en del av en tidsutstrakt plan. Når denne planen formuleres tas det hensyn til at når en eventuelt skal flytte fra en bolig en har flyttet inn i, vil det påløpe flyttekostnader.   Arkivsamling: artikler og foredrag A1806...

Authors
Viggo Nordvik
Year
2001
Type
Academic article