Publications and responsibilities
Low-loss ultrasound transmission through glass assisted by resonance
SINTEF MINALAB - MICRO OPTICS
Nanoimprint for diffractive optics and photonic crystals
Design and Simulation of Efficient Narrowband Thermal Emitter with 3 µm wavelength
A low-power infrared source based on a silicon photonic-crystal membrane has been designed. Temperature distribution and reflection spectrum has been simulated. Large narrowband IR absorption is obtained with optimal material doping....
Design and simulation of efficient narrowband thermal emitter with 3 μm wavelength
A low-power infrared source based on a silicon photonic-crystal membrane has been designed. Temperature distribution and reflection spectrum has been simulated. Large narrowband IR absorption is obtained with optimal material doping...
UV NANO IMPRINT LITOGRAPHY (UV-NIL) AT SINTEF MINALAB
Photoluminescence imaging for characterization of silicon material and solar cell devices
Studying light-induced degradation by lifetime decay analysis: Excellent fit to solution of simple second-order rate equation
Twenty different boron-doped Czochralski silicon materials have been analyzed for light-induced degradation. The carrier lifetime degradation was monitored by an automated quasi-steady-state photoconductance setup with an externally controlled bias lamp for in-situ illumination between measurements...
Characterization of the OSF-band structure in n-type Cz-Si using photoluminescence-imaging and visual inspection
Oxygen induced stacking faults (OSFs) are mainly seen in oxygen rich wafers from the seed end of Cz-silicon crystals. In wafers this ring shaped OSF-region delineates a border between two defect regions; usually silicon self-interstitials dominate outside and vacancies inside this ring. High...