Research group of Material Physics, Oslo

In 2025 we upgraded to a TESCAN SOLARIS FIB-SEM platform combines high-resolution electron imaging with precise ion milling, enabling advanced sample preparation and analysis at the micro- and nanoscale.

Our SEM systems are versatile tools offering high magnification, large depth of focus, and advanced chemical and structural analysis. They deliver highly detailed images of diverse samples, including steels, aluminum alloys, solar cell silicon...

At SINTEF, we provide advanced TEM services as part of the national NORTEM infrastructure, offering access to world-class instrumentation and expertise for atomic-scale materials characterization.

XPS is a powerful technique for surface analysis, providing detailed information about elemental composition and chemical states within the top few nanometres of a material. From 2026 we will use a Kratos AXIS Supra+ system with monochromatic Al Kα...

Our modelling capabilities span multiple scales - from electronic structure to continuum mechanics - providing predictive insights into material properties and guiding experimental design.

SPM techniques allow researchers to “feel” a sample’s surface at the nanoscale, providing insights into topography, conductivity, magnetic properties, and more. By functionalizing the probe, we can tailor measurements to specific material properties.

Our White Light Interferometer provides precise surface topography measurements with nanometer-scale accuracy. It is ideal for characterizing roughness, step heights, inclines, and other critical surface features. We use a Veeco Wyko NT9800.

Our fully motorized Zeiss Axio Imager.Z2 Vario optical microscope enables imaging of both large and thick samples as well as standard small samples. This versatile system supports multiple imaging modes to reveal diverse structural and material...

Precise sample preparation is essential for high-quality imaging and analysis in electron microscopy. In 2025 we moved to a Technoorg Linda SEMPrep Smart system which uses argon ion milling to produce clean, damage-free cross-sections for advanced...

The Laser Flash Apparatus is a high-precision, non-destructive technique for measuring thermal diffusivity and calculating thermal conductivity of solid materials. This is essential for understanding heat transport properties in metals, ceramics, and...

Our tensile testing system measures the mechanical strength of materials under tension, providing critical data for material design and performance evaluation.

Our MonoVista CRS+ Raman Microscope enables Raman spectral analysis for detailed characterization of molecular structure, chemical composition, and material phases. Raman spectroscopy is a non-destructive technique widely used in materials science...

Our sample preparation lab ensures that virtually any sample is ready for high-quality microscopy. From cutting to final surface treatment, we provide precise and reliable preparation for a wide range of materials.