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Reliability and Ruggedness of High Power, High Voltage Power Electronics

Primary Objective

The primary objective is to improve the cost-efficiency of high power converter systems through increased reliability, better understanding of failure mechanisms and tools for lifetime estimation.

Secondary objectives

  • Evaluate and compare thermal stress and efficiency of different state-of –the-art converter topologies.
  • Development of accelerated lifetime test methods for high power, high voltage power electronics relevant for real applications. Contribution towards standardization of such tests.
  • Contribute towards development of robust power electronic components with focus on obtaining stable and predictable behaviour during and after fault conditions and consequently reducing downtime of HV converters.
  • Develop a lifetime model for state-of-the-art IGBT devices based on experience from existing models.
  • Development of methodology for online estimation of remaining lifetime of a semiconductor device. This methodology should be able to detect abnormal operation conditions and give early warnings of failure.
  • Strengthen the education of applied power electronics at NTNU on topics related to reliability of power semiconductors.


Link to the project website  

Published 23 May 2017
Senior Research Scientist
930 03 738

Project duration

2015 - 2019