White Light Interferometry
Our White Light Interferometer provides precise surface topography measurements with nanometer-scale accuracy. It is ideal for characterizing roughness, step heights, inclines, and other critical surface features. We use a Veeco Wyko NT9800.
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What is WLI?
The WLI is based on an optical microscope and uses interference between a sample signal and a reference signal to measure height with 10 nm accuracy over several millimeters. This non-contact technique ensures reliable measurements without damaging the sample.
Capabilities:
- Non-Contact Topography Mapping: Height determination at each point for roughness and step height analysis.
- High Accuracy: Vertical resolution down to 10 nm across large areas.
- Very flat surfaces: Vertical resolution < 1 nm in monochromatic mode.
- Non-Destructive Measurement: No vacuum required, preserving sample integrity.
- Large Sample Accommodation: Handles samples of various shapes and sizes.
Applications:
- Surface roughness characterization for metals, polymers, and composites.
- Step height and layer thickness measurements in microelectronics.
- Quality control for coatings and thin films.
- Research on functional surfaces for energy and optical devices.
