Scanning Electron Microscopy (SEM)
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What is SEM?
SEM: Provides ultra-detailed imaging of surfaces, revealing morphology, structure, and composition. SEM is widely used for materials characterization across metals, polymers, composites, and functional materials.
Our Instruments
Phenom G2 XL Desktop SEM: A fast, automated desktop SEM with a large sample capacity, ideal for high-throughput imaging. Our favourite feature is its support for Python scripting, enabling custom workflow automation.
FEI Nova NanoSEM 650: A high-resolution FEG-SEM with advanced analytical capabilities. Our favourite feature is large sample chamber allowing large samples, in-situ experiments and a multitude of detectors.
Integrated Analysis Tools:
- Energy Dispersive X-ray Spectroscopy (EDS): Measures chemical elements from boron to uranium. Composition mapping enables visualization of layered structures, composites, and unwanted elements.
- Electron Backscatter Diffraction (EBSD): Investigates and maps crystal structures, offering insights into properties that govern macroscopic behavior in metals and alloys.
- Transmission Detector: Enables observation of thin lamellas and inspection of TEM samples in STEM mode.
Capabilities:
- Low-Vacuum Mode: Images electrically insulating samples without coating.
- Multi-Sample Holder & Automation: Combined with scripting for unattended imaging of dozens of samples—boosting efficiency.
- Large Sample Chamber: Accommodates bulky samples and supports in-situ experiments (e.g., tensile testing, temperature variation).
- In-Chamber Plasma Cleaner & Cold Finger: Maintains a clean environment, reducing contamination for high-magnification imaging.
- In-situ measurements: The electrical feedthrough allows in-situ biasing, heating and cooling (with access to all detectors) and live SEM imaging of tensile testing.
- Vacuum or inert sample transfer: Transport of samples from the FIB, via a glove box, to our FEG-SEM.
- Surface topography, height, and porosity mapping.
Applications:
- Structural and chemical analysis of metals, alloys, and composites
- Semiconductor and electronics inspection
- Energy materials (fuel cells, batteries, hydrogen membranes)
- Medical devices and polymer research
- In-situ mechanical and thermal studies
Why it matters:
SEM is a cornerstone technique in materials science, offering high-resolution imaging, chemical analysis, and surface characterization across a wide range of materials. Its ability to visualize microstructures and detect compositional variations makes it essential for failure analysis, quality control, and materials development. Whether you're working with metals, polymers, electronics, or energy materials, SEM provides the insights needed to understand performance and guide innovation.
