TEM Characterization of near Sub-Grain Boundary Dislocations in Directionally Solidified Multicrystalline Silicon

Author(s)

• Maulid Mohamed Kivambe
• Gaute Stokkan
• Torunn Ervik
• Birgit Ryningen
• Otto Lohne

Affiliation

• Norwegian University of Science and Technology
• SINTEF Industry / Sustainable Energy Technology

DOI