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X-ray photoelectron spectroscopy study of MgH2 thin films grown by reactive sputtering

Category

Academic article

Language

English

Author(s)

Affiliation

  • SINTEF
  • Delft University of Technology
  • University of Surrey
  • University of Oslo

Year

2010

Published in

Surface and Interface Analysis

ISSN

0142-2421

Volume

42

Issue

6-7

Page(s)

1140 - 1143

View this publication at Norwegian Research Information Repository