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Investigation of veryintenseD 3-band emission in multi-crystalline silicon wafers using electron microscopy and hyperspectral photoluminescence imaging

Category

Academic article

Client

  • Research Council of Norway (RCN) / 280909
  • Research Council of Norway (RCN) / 197405

Language

English

Author(s)

Affiliation

  • SINTEF Industry / Sustainable Energy Technology
  • SINTEF Industry / Materials and Nanotechnology
  • Norwegian University of Life Sciences
  • Institute for Energy Technology

Date

12.04.2022

Year

2022

Published in

Journal of Applied Physics

ISSN

0021-8979

Publisher

AIP Publishing (American Institute of Physics)

Volume

131

Issue

14

View this publication at Cristin