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Interfacial atomic structure and electrical activity of nano-facetted CSL grain boundaries in high-performance multi-crystalline silicon

Category

Academic article

Language

English

Author(s)

Affiliation

  • Norwegian University of Science and Technology
  • SINTEF Industry / Materials and Nanotechnology
  • SINTEF Industry / Sustainable Energy Technology

Year

2020

Published in

Journal of Applied Physics

ISSN

0021-8979

Publisher

American Institute of Physics (AIP)

Volume

127

Issue

12

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