Characterization of SINTEF 3D diodes with trenched-electrode geometry before and after neutron irradiation

Author(s)

• Roberto Mendicino
• Angela Kok
• Ozhan Koybasi
• Marco Povoli
• Anand Summanwar
• Gian-Franco Dalla Betta

Affiliation

• National Institute of Nuclear Physics
• SINTEF Digital / Smart Sensors and Microsystems
• University of Trento

Issue

2

External resources

• https://iopscience.iop.org/article/10.1088/1748-0221/15/02/c02023/pdf

DOI