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Characterization of SINTEF 3D diodes with trenched-electrode geometry before and after neutron irradiation

Category

Academic article

Language

English

Author(s)

Affiliation

  • National Institute of Nuclear Physics
  • SINTEF Digital / Microsystems and Nanotechnology
  • University of Trento

Year

2020

Published in

Journal of Instrumentation (JINST)

ISSN

1748-0221

Publisher

IOP Publishing

Volume

15

Issue

2

Page(s)

1 - 9

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