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Magnar Hernes

Senior Research Scientist

Magnar Hernes

Senior Research Scientist

Magnar Hernes
Phone: 930 03 738
Email:
Department: Energy Systems
Office: Trondheim

Publications and responsibilities

Publication
https://www.sintef.no/en/publications/publication/1950093/

Two failure mechanisms can generally be identified by means of accelerated power cycling tests on IGBT power modules: bond-wire lift-off and die-solder delamination. Aging associated to bond-wire liftoff is detected by monitoring the increase of collector-emitter voltage while aging linked to die...

Authors Magnar Hernes Salvatore D'Arco Ole Christian Spro Dimosthenis Peftitsis
Year 2021
Type Academic chapter/article/Conference paper
Publication
https://www.sintef.no/en/publications/publication/1950098/

This paper presents results from experimental tests intended to assess the validity of linear damage superposition using Miner’s rule for IGBT power modules. Such validity is crucial, for example, when applying Miner's rule in combination with power cycling lifetime models for estimating converter...

Authors Magnar Hernes Salvatore D'Arco Ole Christian Spro Dimosthenis Peftitsis
Year 2021
Type Academic chapter/article/Conference paper
Publication
https://www.sintef.no/en/publications/publication/1702309/

The aim of this work is to obtain a reliable estimation of the remaining lifetime of power-electronic modules. Lifetime models provide information on the fatigue durability of power modules under repetitive loading circumstances. However, the thermo-mechanical stresses that a device is exposed to...

Authors Antonios Antonopoulos Salvatore D'Arco Magnar Hernes Dimosthenis Peftitsis
Year 2019
Type Academic chapter/article/Conference paper
Publication
https://www.sintef.no/en/publications/publication/1638774/

This paper investigates the power cycling methodology for reliability testing of SiC metal-oxide-semiconductor field-effect transistors (MOSFETs). Dedicated test benches were designed and built to study this issue. The results indicate that power cycling of SiC MOSFETs is affected by threshold...

Authors Fredrik T. B. W. Göthner Ole Christian Spro Magnar Hernes Dimosthenis Peftitsis
Year 2018
Type Academic chapter/article/Conference paper
Publication
https://www.sintef.no/en/publications/publication/1637260/

This paper presents a driver topology intended for WBG devices with the goal of improving the switching performance. In particular, the initial delay time of the switching transient was targeted. In high power and high frequency bridge converters, the dead time causes output voltage waveform...

Authors Ole Christian Spro Giuseppe Guidi Kjell Ljøkelsøy Magnar Hernes Ole-Morten Midtgård Tore Marvin Undeland
Year 2018
Type Academic chapter/article/Conference paper
Publication
https://www.sintef.no/en/publications/publication/1391562/

This paper presents a numerical analysis of the temperature profiles within the semiconductor devices of modular multilevel converters (MMCs). These temperature profiles are essential for assessing the power-cycling lifetime of IGBT modules, which influences the converter reliability. An electro...

Authors Gilbert Bergna Diaz Salvatore D'Arco Jon Are Wold Suul Magnar Hernes
Year 2016
Type Academic chapter/article/Conference paper