TEM techniques
Our group at SINTEF uses a range of advanced Transmission Electron Microscopy (TEM) techniques to investigate materials at the nanoscale. These methods provide exceptional precision for studying structure, composition, and properties.
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Capabilities
- High-Resolution TEM (HRTEM): Direct imaging of atomic arrangements in crystalline materials. Essential for analyzing defects, interfaces, and nanostructures.
- Scanning TEM (STEM): Combines focused electron beam scanning with high-angle detectors for detailed contrast and compositional maps. Enables high-resolution analytical techniques like EDS and EELS.
- Electron Diffraction: Determines crystal structure, orientation, and phase identification by analyzing electron scattering—ideal for nanocrystalline or complex materials.
- Energy-Dispersive X-ray Spectroscopy (EDS): Elemental analysis and mapping at the nanoscale using characteristic X-ray emission.
- Electron Energy Loss Spectroscopy (EELS): Measures energy loss of electrons passing through a sample. Monochromated EELS offers enhanced energy resolution for chemical bonding, electronic structure, and light-element analysis.
Applications
- Atomic-scale imaging of defects and interfaces
- Compositional mapping of heterogeneous materials
- Crystallographic analysis of nanostructures
- Electronic structure studies in thin films and coatings
