TEM sample requirements
High-quality Transmission Electron Microscopy (TEM) results depend on proper sample preparation. Samples must be electron-transparent, typically below 100 nm in thickness, to allow effective imaging and analysis.
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Materials We Work With
- Metals and alloys
- Semiconductors
- Ceramics
- Polymers
- Nanomaterials
Preparation Methods
We offer guidance and support for preparing samples using:
- Mechanical Thinning and Polishing: For bulk materials.
- Ion Milling: Produces damage-free thin sections.
- Focused Ion Beam (FIB): Site-specific preparation for complex structures.
- Drop-Casting or Grid Mounting: For nanoparticles and soft materials.
Need Help?
If you’re unsure whether your sample is suitable for TEM, contact us to discuss preparation strategies tailored to your material and research goals.
