Transmission electron microscopy (TEM)
At SINTEF, we provide advanced TEM services as part of the national NORTEM infrastructure, offering access to world-class instrumentation and expertise for atomic-scale materials characterization.
Contact persons
What is TEM?
Transmission Electron Microscopy uses a high-energy electron beam transmitted through an ultra-thin sample to achieve atomic-scale resolution. This technique reveals crystal structure, chemical composition, and defects that govern material properties—information that is impossible to obtain with conventional microscopy.
Our Instruments
- JEOL 2100F: A versatile field-emission TEM for high-resolution imaging and analytical work.
- ThermoFisher Titan G2 60-300: Currently in operation until 2026.
- Coming Soon – JEOL Mono ARM: Next-generation TEM with enhanced imaging, spectroscopy, and analytical performance.
Capabilities
- High-Resolution Imaging: Atomic-scale visualization of defects, interfaces, and nanostructures.
- Crystallographic Analysis: Electron diffraction for phase identification and orientation mapping.
- Chemical Mapping: Elemental and bonding analysis using EDS and monochromated EELS.
- Advanced Techniques: STEM, HRTEM, and in-situ experiments under controlled environments.
- Inert Sample Transfer: Ability to move samples from fabrication in the FIB, via a glove box, to the TEM.
Applications
- Nanotechnology and energy materials
- Metallurgy and semiconductors
- Thin films, coatings, and interfaces
- Failure analysis and advanced material design
Why It Matters
TEM is essential for nanotechnology, energy materials, and semiconductors, where performance depends on atomic-level features. By combining imaging, diffraction, and spectroscopy, TEM provides insights that drive innovation in advanced materials and devices.
Explore More:
