Scanning Probe Microscopy (SPM)
SPM techniques allow researchers to “feel” a sample’s surface at the nanoscale, providing insights into topography, conductivity, magnetic properties, and more. By functionalizing the probe, we can tailor measurements to specific material properties.
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What is SPM?
SPM uses a sharp probe to scan the surface of a sample, detecting variations in physical or functional properties. This enables high-resolution mapping of features such as roughness, electrical conductivity, magnetic domains, and even superconducting behavior.
Capabilities:
- Atomic Force Microscopy (AFM): Measures surface topography with nanometer precision.
- Conductive AFM (cAFM): Maps local electrical conductivity.
- Magnetic Force Microscopy (MFM): Visualizes magnetic microstructures.
- Piezoresponse Force Microscopy (PFM): Detects ferroelectric domains and piezoelectric properties.
- Kelvin Probe Force Microscopy (KPFM): Measures surface potential and work function.
- Liquid and Gas Cell Holders: Enable in-operando measurements under controlled environments.
Applications:
- Roughness analysis for biomedical materials (e.g., bone implants).
- Mapping 2D conductive features such as ferroic domain walls.
- Magnetic microstructure studies (e.g., Kagome ferromagnets).
- Spatially resolved superconducting property measurements.
- Nanoengineering of defects for advanced material design.
Why It Matters
SPM bridges the gap between nanoscale functional properties and macroscopic performance, supporting both academic research and industrial development. Our team provides tailored measurements, data interpretation, and reporting to accelerate innovation.