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Characterization of SINTEF 3D diodes with trenched-electrode geometry before and after neutron irradiation

Characterization of SINTEF 3D diodes with trenched-electrode geometry before and after neutron irradiation

Category
Academic article
Language
English
Author(s)
Affiliation
  • National Institute of Nuclear Physics
  • SINTEF Digital / Microsystems and Nanotechnology
  • University of Trento
Year
2020
Published in
Journal of Instrumentation (JINST)
ISSN
1748-0221
Publisher
Institute of Physics Publishing (IOP)
Volume
15
Issue
2
Page(s)
1 - 9