Characterization of SINTEF 3D diodes with trenched-electrode geometry before and after neutron irradiation
Characterization of SINTEF 3D diodes with trenched-electrode geometry before and after neutron irradiation
Category
Academic article
Language
English
Affiliation
- National Institute of Nuclear Physics
- SINTEF Digital / Microsystems and Nanotechnology
- University of Trento
Year
2020
Published in
Journal of Instrumentation (JINST)
ISSN
1748-0221
Publisher
Institute of Physics Publishing (IOP)
Volume
15
Issue
2
Page(s)
1 - 9
External resources