Near infrared low coherence speckle interferometry (NIR-LCSI) as a tool for the investigation of silicon in solar cell production
Category
Academic article
Language
English
Author(s)
- Kay Gastinger
- Lars Johnsen
Affiliation
- SINTEF Digital
- SINTEF Digital / Smart Sensors and Microsystems
Year
2010Published in
Proceedings of SPIE, the International Society for Optical Engineering
ISSN
0277-786X
Publisher
SPIE - The International Society for Optics and Photonics
Volume
7387