To main content

TEM Characterization of near Sub-Grain Boundary Dislocations in Directionally Solidified Multicrystalline Silicon

Category

Academic article

Language

English

Author(s)

Affiliation

  • SINTEF Industry / Sustainable Energy Technology
  • Norwegian University of Science and Technology

Year

2011

Published in

Solid State Phenomena

ISSN

1012-0394

Volume

178-179

Page(s)

307 - 312

View this publication at Norwegian Research Information Repository