A Critical Comparison Among High-Resolution Methods for Spatially Resolved Nano-Scale Residual Stress Analysis in Nanostructured Coatings

Author(s)

• Saqib Rashid
• Edoardo Rossi
• Spyros Diplas
• Patricia Almeida Carvalho
• Damian Pucicki
• Rafal Kuna
• Marco Sebastiani

Affiliation

• SINTEF Industry / Sustainable Energy Technology
• Third University of Rome
• Poland
• Wroclaw University of Technology

Issue

7

DOI