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Dynamic observation of dislocation evolution and interaction with twin boundaries in silicon crystal growth using in – situ synchrotron X-ray diffraction imaging

Dynamic observation of dislocation evolution and interaction with twin boundaries in silicon crystal growth using in – situ synchrotron X-ray diffraction imaging

Category
Academic article
Language
English
Author(s)
Affiliation
  • Norwegian University of Science and Technology
  • University of Toulon
  • SINTEF Industry / Sustainable Energy Technology
  • SINTEF Industry
Year
Published in
Acta Materialia
ISSN
1359-6454
Publisher
Pergamon Press
Volume
210