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Electromagnetic Oscillation Origin Location in Multiple-Inverter-Based Power Systems Using Components Impedance Frequency Responses

Abstract

Existing impedance-based stability criterion (IBSC) for electromagnetic stability assessment of multiple-grid-connected-inverter (GCI)-based power systems suffers from several limitations. First, global stability feature is hard to be obtained if Nyquist-criterion-based IBSC is used. Second, heavy computational burdens caused by either right-half-plane (RHP) poles calculation of impedance ratios or nodal admittance matrix construction can be involved. Third, it's not easy to locate the oscillation origin. This article aims to overcome the aforementioned three limitations of the existing IBSC. First, frequency responses of the load impedance and source admittance defined at each node in a selected components aggregation path are obtained by aggregating individual components, from which imaginary parts of RHP poles of these load impedances and source admittances are directly identified without knowing analytical expressions of these load impedances and source admittances. Then, based on the Nyquist plots of minor loop gains, stability features of these selected nodes are obtained. Finally, if some nodes are unstable, the oscillation origin is located based on numbers of the RHP poles of these load impedances and source admittances. Compared to the existing IBSC, the presented method can assess global stability and locate oscillation origin more efficiently. The local circulating current issue can also be identified.
INDEX TERMS Circulating current, impedance frequency responses, grid-connected inverter, impedancebased stability criterion, oscillation origin location.

Category

Academic article

Language

English

Author(s)

Affiliation

  • Aalborg University
  • SINTEF Energy Research / Energisystemer
  • Norwegian University of Science and Technology
  • Monash University

Year

2021

Published in

IEEE Open Journal of the Industrial Electronics Society (OJ-IES)

ISSN

2644-1284

Publisher

IEEE

Volume

2

Page(s)

1 - 20

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