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Test beam characterization of irradiated SINTEF 3D pixel sensors

Category

Lecture

Client

  • Research Council of Norway (RCN) / 269752
  • Research Council of Norway (RCN) / 255182

Language

English

Author(s)

Affiliation

  • University of Oslo
  • University of Bergen
  • Unknown
  • SINTEF Digital / Microsystems and Nanotechnology

Presented at

14th Trento Workshop on Advanced Silicon Radiation Detectors

Date

25.02.2019 - 27.02.2019

Year

2019

View this publication at Cristin