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Test beam characterization of irradiated SINTEF 3D pixel sensors

Test beam characterization of irradiated SINTEF 3D pixel sensors

Category
Lecture
Client
  • Research Council of Norway (RCN) / 269752
  • Research Council of Norway (RCN) / 255182
Language
English
Author(s)
Affiliation
  • University of Oslo
  • University of Bergen
  • Unknown
  • SINTEF Digital / Microsystems and Nanotechnology
Presented at
14th Trento Workshop on Advanced Silicon Radiation Detectors
Date
25.02.2019 - 27.02.2019
Year