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Edge-on Detectors with Active Edge for X-Ray Photon Counting

Edge-on Detectors with Active Edge for X-Ray Photon Counting

Category
Conference lecture and academic presentation
Language
English
Author(s)
Affiliation
  • SINTEF Digital / Microsystems and Nanotechnology
  • SINTEF Digital / Smart Sensor Systems
Presented at
IEEE NSS-MIC
Place
Valencia
Date
22.10.2011 - 28.10.2011
Organizer
IEEE
Year
2011