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Photoluminescence imaging for characterization of silicon material and solar cell devices

Photoluminescence imaging for characterization of silicon material and solar cell devices

Category
Academic lecture
Language
English
Author(s)
Affiliation
  • SINTEF Digital / Microsystems and Nanotechnology
  • Unknown
  • University of Oslo
Presented at
Norwegian Electro-optics meeting 2014
Date
23.04.2014 - 23.04.2014
Year
2014