Near infrared low coherence speckle interferometry (NIR-LCSI) as a tool for the investigation of silicon in solar cell production
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Category
Academic article
Language
English
Author(s)
- Kay Gastinger
- Lars Johnsen
Affiliation
- SINTEF Digital / Smart Sensors and Microsystems
Year
2010Published in
Proceedings of SPIE, the International Society for Optical Engineering
ISSN
0277-786X
Volume
7387
View this publication at Norwegian Research Information Repository