Frame by Frame Wavelet Decomposition of Electrical Capacitance Values for Real Time Tomometric Applications
Category
Academic chapter/article/Conference paper
Language
English
Author(s)
- Ru Yan
- Saba Mylvaganam
Affiliation
- University of South-Eastern Norway
- SINTEF Industry / Process Technology
Year
2011Publisher
IEEE Press
Book
IEEE SENSORS 2011 Limerick, Irland 28-31 October University og Limerick Proceedings
ISBN
978-1-4244-9288-6
Page(s)
1851 - 1855