Frame by Frame Wavelet Decomposition of Electrical Capacitance Values for Real Time Tomometric Applications
Category
Academic chapter
Language
English
Author(s)
- Ru Yan
- Saba Mylvaganam
Affiliation
- SINTEF Industry / Process Technology
- University of South-Eastern Norway
Year
2011Publisher
IEEE Press
Book
IEEE SENSORS 2011 Limerick, Irland 28-31 October University og Limerick Proceedings
ISBN
9781424492886
Page(s)
1851 - 1855
View this publication at Norwegian Research Information Repository