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Investigation of the areas with high D07-band emission in multicrystalline silicon wafers using electron microscopy and hyperspectral photoluminescence imaging

Category

Academic article

Language

English

Author(s)

Affiliation

  • SINTEF Industry
  • SINTEF Industry / Sustainable Energy Technology
  • Norwegian University of Life Sciences
  • SINTEF Industry / Materials and Nanotechnology
  • Institute for Energy Technology

Year

2024

Published in

Journal of Applied Physics

ISSN

0021-8979

Publisher

AIP Publishing (American Institute of Physics)

Volume

135

Issue

13

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