A blockchain-based framework for trusted quality data sharing towards zero-defect manufacturing
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Category
Academic article
Client
- EC/H2020 / 958357
Language
English
Author(s)
- Mauro Isaja
- Phu Nguyen
- Arda Goknil
- Sagar Sen
- Erik Johannes Husom
- Simeon Tverdal
- Abhilash Ramanathapuram Anand
- Yunman Jiang
- Karl John Pedersen
- Per Myrseth
- Jørgen Stang
- Harris Niavis
- Simon Pfeifhofer
- Patrick Lamplmair
Affiliation
- Italy
- SINTEF Digital / Sustainable Communication Technologies
- DNV
- Greece
- Austria
Year
2023Published in
Computers in industry (Print)
ISSN
0166-3615
Volume
146