Atomic-scale 3D imaging of individual dopant atoms in an oxide semiconductor

Client

• Research Council of Norway (RCN) / 269842
• Research Council of Norway (RCN) / 197405
• Research Council of Norway (RCN) / 295864
• ERC-European Research Council / 863691
• Research Council of Norway (RCN) / 302506
• Sigma2 / NN9264K

Author(s)

• Kasper Aas Hunnestad
• Constantinos Hatzoglou
• Muhammad Zeeshan Khalid
• Per Erik Vullum
• Zewu Yan
• Edith Bourret
• Antonius Van Helvoort
• Sverre Magnus Selbach
• Dennis Meier

Affiliation

• Norwegian University of Science and Technology
• SINTEF Industry / Materials and Nanotechnology
• ETH Zurich
• Lawrence Berkeley National Laboratory

Issue

1

External resources

• https://www.nature.com/articles/s41467-022-32189-0

DOI

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