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Microelectronics Technologies Scaling and Reliability A Comparison Study for High Temperature and Radiation Hard Applications

Category

Academic article

Language

English

Author(s)

  • Ovidiu Vermesan
  • Lars-Cyril Blystad
  • Hanne Grindvoll
  • Geir Uri Jensen
  • Berit Sundby Avset

Affiliation

  • SINTEF Digital / Connectivity Technologies and Platforms
  • University of South-Eastern Norway
  • SINTEF Digital / Microsystems and Nanotechnology
  • Unknown

Year

2001

Published in

HiTEN

ISSN

2380-4491

View this publication at Cristin