Scanning electron diffraction as a versatile tool for studying the microstructure of Al alloys
Category
Conference lecture
Language
English
Author(s)
- Jonas Kristoffer Sunde
- Sigurd Wenner
- Calin Daniel Marioara
- Antonius Van Helvoort
- Randi Holmestad
Affiliation
- SINTEF Industry / Materials and Nanotechnology
- Norwegian University of Science and Technology
Presented at
Microscience Microscopy Congress 2019
Place
Manchester, Storbritannia
Date
01.07.2019 - 04.07.2019
Organizer
Royal Microscopical Society
Year
2019View this publication at Norwegian Research Information Repository