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Monitoring selective etching of self-assembled nanostructured a-Si:Al films

Category

Academic article

Language

English

Author(s)

Affiliation

  • SINTEF Industry / Sustainable Energy Technology
  • University of Oslo

Year

2019

Published in

Nanotechnology

ISSN

0957-4484

Volume

30

Issue

13

Page(s)

1 - 5

View this publication at Norwegian Research Information Repository