Scanning precession electron diffraction used to determine precipitate microstructure and its evolution during aging in Al-Mg-Si(-Cu) alloys
Category
Conference lecture
Language
English
Author(s)
- Randi Holmestad
- Jonas Kristoffer Sunde
- Elisabeth Thronsen
- Calin Daniel Marioara
- Antonius Van Helvoort
- Kenji Matsuda
Affiliation
- SINTEF Industry / Materials and Nanotechnology
- Norwegian University of Science and Technology
Presented at
61. Japanese Microscopy Symphosium
Place
Toyama
Date
01.11.2018 - 03.11.2018
Organizer
Japanese Society of Microscopy
Year
2018View this publication at Norwegian Research Information Repository