Characterisation of Beam Sensitive Quartz by Scanning TEM
Category
Conference poster
Language
English
Author(s)
- Jochen Busam
- Sigurd Wenner
- Astrid Marie Muggerud
- Antonius Van Helvoort
Affiliation
- SINTEF Industry / Materials and Nanotechnology
- Norwegian University of Science and Technology
Presented at
Scandem 2018
Place
Copenhagen
Date
25.06.2018 - 28.06.2018
Organizer
CEN-DTU/Scandem
Year
2018View this publication at Norwegian Research Information Repository