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Scanning transmission electron microscopy of beam sensitive quartz

Category

Conference poster

Language

English

Author(s)

  • Jochen Busam
  • Sigurd Wenner
  • Astrid Marie Muggerud
  • Antonius Van Helvoort

Affiliation

  • SINTEF Industry / Materials and Nanotechnology
  • Norwegian University of Science and Technology

Presented at

EMAG2018

Place

Warwick

Date

04.07.2018 - 06.07.2018

Organizer

IoP

Year

2018

View this publication at Norwegian Research Information Repository