To main content

Structural Characterization of Natural Quartz by Scanning TEM

Abstract

For quartz, despite its industrial importance and an extensive amount of research done on it, there are still open fundamental questions, e.g. regarding crystal defects, phase changes or damage mechanisms under ionizing radiation [1,2]. Transmission electron microscopy (TEM), widely deployed to investigate crystal structures down to Å level, has scarcely been published with respect to quartz in the last decades. The reason for this, beside challenges in preparing good specimens, is that this mineral is very beam sensitive and rapidly becomes amorphous during TEM investigations.
Read the publication

Category

Academic article

Language

English

Author(s)

  • Jochen Busam
  • Sigurd Wenner
  • Astrid Marie Muggerud
  • Antonius Van Helvoort

Affiliation

  • SINTEF Industry / Materials and Nanotechnology
  • Norwegian University of Science and Technology
  • Diverse norske bedrifter og organisasjoner

Year

2018

Published in

Microscopy and Microanalysis

ISSN

1431-9276

Volume

24

Page(s)

2044 - 2045

View this publication at Norwegian Research Information Repository