Methodology to Improve Strain Measurement in III–V Semiconductors Materials

Client

• Research Council of Norway (RCN) / 197405
• Research Council of Norway (RCN) / 228956

Author(s)

• Maryam Vatanparast
• Per Erik Vullum
• Turid Worren Reenaas
• Randi Holmestad
• Magnus Kristofer Nord

Affiliation

• Norwegian University of Science and Technology
• SINTEF Industry / Materials and Nanotechnology
• University of Glasgow

Issue

S1

DOI

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