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Bandgap measurement of high refractive index materials by off-axis EELS

Category

Academic article

Client

  • Research Council of Norway (RCN) / 197405
  • Research Council of Norway (RCN) / 228956

Language

English

Author(s)

  • Maryam Vatanparast
  • Ricardo Egoavil
  • Turid Worren Reenaas
  • Johan Verbeeck
  • Randi Holmestad
  • Per Erik Vullum

Affiliation

  • Norwegian University of Science and Technology
  • University of Antwerp
  • SINTEF Industry / Materials and Nanotechnology

Date

19.06.2017

Year

2017

Published in

Ultramicroscopy

ISSN

0304-3991

Publisher

Elsevier

Volume

182

Page(s)

92 - 98

View this publication at Cristin