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3D Detector Activities at SINTEF MiNaLab – Wafer Bonding, and Deep Reactive Ion Etching

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Category

Academic lecture

Language

English

Author(s)

Affiliation

  • SINTEF Digital / Smart Sensors and Microsystems

Presented at

International Wafers Level Packaging Conference

Place

San Jose

Date

13.10.2008 - 16.10.2008

Organizer

SMTA

Year

2008

External resources

View this publication at Cristin