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Edge-on Detectors with Active Edge for X-Ray Photon Counting

Category

Conference lecture

Language

English

Author(s)

Affiliation

  • SINTEF Digital / Smart Sensors and Microsystems

Presented at

IEEE NSS-MIC

Place

Valencia

Date

23.10.2011 - 29.10.2011

Organizer

IEEE

Year

2011

View this publication at Norwegian Research Information Repository