New Characterization methods for SPD nanostructured materials--invited talk
Several new methods for characterization of nano structrued materials prepared by severe plastic deformation, 3D-EBSD, 3D-atom probe tomography and TEM-based EBSD are introduced. Some applicaiton examples are given.
- Yanjun Li
- SINTEF Industry / Materials and Nanotechnology
NTNU, Nano_SPD workshop
14.12.2010 - 15.12.2010
Department of Materials Science and Engineering, NTNU